D3T-2008

 

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Call for Paper (pdf)

ITC 2008

Final Program

Organizing/Program Committee

Registration

Hotel/Travel

The IEEE International Workshop on

Defect and Data Driven Testing (D3T-2008)

(Formerly known as Defect-Based Testing Workshop (DBT))

 

October 30 - 31, 2008 Santa Clara Convention Center, Santa Clara, CA

Will be held in conjunction with ITC Test Week (ITC-2008)

 

Submission Deadline: August 26, 2008

Notification of Acceptance: September 19, 2008

Camera Ready Paper: September 26, 2008

Previous Events

DBT 2007

DBT 2006

DBT 2005

DBT 2004

DBT 2000

 

 

 

Technical Committee

 

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PROGRAM CHAIR

Mohammad Tehranipoor

University of Connecticut

 

GENERAL CHAIR

Rob Aitken

ARM

VICE-PROGRAM CHAIR

Al Crouch

Asset-Intertech

FINANCE CHAIR

Sankaran M. Menon

Intel Corporation

 

PUBLICITY CHAIR

Arani Sinha

AMD

 

PUBLICATION CHAIR

Nisar Ahmed

Texas Instruments

 

STEERING COMMITTEE

Sankaran Menon, Intel

Adit Singh, Auburn Univ.

Hank Walker, Texas A&M

Hans Manhaeve, Q-Start Test

Jim Plusquellic, U. New Mexico

PROGRAM COMMITTEE

Tom Bartenstein, Cadence

Ken Butler, TI

Krish Chakrabarty, Duke Univ.

Sreejit Chakravarty, LSI Logic

John Carulli, TI

Bruce Cory, Nvidia

Jennifer Dworak, Brown University

Patrick Girard, LIRRM

Sandeep Goel, LSI Logic

Rohit Kapur, Synopsys

Ajay Koche, Verigy

Mike Laisne, Qualcomm

Nilanjan Mukherjee, Mentor Graphics

Teresa McLaurin, ARM

Martin Margala, U-Mass

Amit Nahar, TI

Suriyaprakash Natarajan, Intel  

Jay Orbon, Verigy

Rajesh Raina, Freescale

Sagar Sabade, Qualcomm

Mani Soma, UW

Claude Thibeault,Ecole Tech

Li C. Wang, UCSB              

Xiaoqing Wen, Kyushu Institute of Tech.

LeRoy Winemberg, Freescale

Qiang Xu, CUHK